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Applied Reliability, Third Edition [Hardcover]

Paul A. Tobias , David Trindade
4.0 out of 5 stars  See all reviews (1 customer review)
List Price: CDN$ 111.20
Price: CDN$ 94.44 & FREE Shipping. Details
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Book Description

Aug. 26 2011 1584884665 978-1584884668 3

Since the publication of the second edition of Applied Reliability in 1995, the ready availability of inexpensive, powerful statistical software has changed the way statisticians and engineers look at and analyze all kinds of data. Problems in reliability that were once difficult and time consuming even for experts can now be solved with a few well-chosen clicks of a mouse. However, software documentation has had difficulty keeping up with the enhanced functionality added to new releases, especially in specialized areas such as reliability analysis.

Using analysis capabilities in spreadsheet software and two well-maintained, supported, and frequently updated, popular software packages—Minitab and SAS JMP—the third edition of Applied Reliability is an easy-to-use guide to basic descriptive statistics, reliability concepts, and the properties of lifetime distributions such as the exponential, Weibull, and lognormal. The material covers reliability data plotting, acceleration models, life test data analysis, systems models, and much more. The third edition includes a new chapter on Bayesian reliability analysis and expanded, updated coverage of repairable system modeling.

Taking a practical and example-oriented approach to reliability analysis, this book provides detailed illustrations of software implementation throughout and more than 150 worked-out examples done with JMP, Minitab, and several spreadsheet programs. In addition, there are nearly 300 figures, hundreds of exercises, and additional problems at the end of each chapter, and new material throughout.

Software and other files are available for download online


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About the Author

Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society’s Lifetime Achievement Award.


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Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover
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Most helpful customer reviews
4.0 out of 5 stars Definitely Readable Dec 3 2008
Format:Hardcover
I found this book readable and covers what I bought it for, namely, the use of Weibull statistics in reliability. It also covers many other topics that I have not gotten to yet. I'm satisfied
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Most Helpful Customer Reviews on Amazon.com (beta)
Amazon.com: 4.8 out of 5 stars  4 reviews
23 of 23 people found the following review helpful
4.0 out of 5 stars A very good book, but contains some annoying typing errors Aug. 10 1997
By A Customer - Published on Amazon.com
Format:Hardcover
A book with a very application oriented treatment of reliability, based on electronics industries experience. It uses an advanced style of explanation, i.e. assumes that readers have mastered certain topics/knowledge/techniques in reliability.
However, prerequisites for reading this book must be clearly stated; i.e. what basics are required, are the basics given in the books enough, etc.
Some typos appear in description of table/figure (i.e. table 6.7 written as table 1.7).
Also some computational errors appeared in the answers to selected problems.
These are indeed small errors, however they detract from a good book's image.
Especially for new students in reliability and would-be practicioners, the answers to the problems in the book are very necessary to provide concept/technique mastery and understanding check. Why do not the authors provide answers to ALL problems?
One possible thing to add to the contents is the design of reliability experiments, i.e. the general concepts and some examples drawn from some areas of interest (mechanical, electrical).
2 of 2 people found the following review helpful
5.0 out of 5 stars Overall Best Reliability Engineering Reference Oct. 2 2011
By Book Fan - Published on Amazon.com
Format:Hardcover
Having used the various editions of Reliability Engineering in my work for many years, I can report that I have found it to be the most useful reference available. While there are many other books about reliability engineering, the others are either too applied (overly focused on the engineering) or too mathematical (not concerned enough with the application). This text has found the sweet spot: not only does it do due diligence to the mathematics without getting lost in it, it also ties the computational techniques to problems similar to those in my work. In addition this new edition shows how to use readily accessible computer applications for the necessary calculations, a very useful added benefit.
5.0 out of 5 stars Added bookmark can not be recalled April 1 2014
By Fredric Yeung - Published on Amazon.com
Format:Kindle Edition|Verified Purchase
Book is good. For Kindle version, when I try to add bokmark and go back later. I found bookmarks are not appeared in the "Go To" list (just have choice of "Cover" and "Page"). Where's my bookmarks gone ?
5.0 out of 5 stars Great book! Very easy to read and understand Feb. 3 2013
By Tiffany Wang - Published on Amazon.com
Format:Hardcover|Verified Purchase
This is the required textbook from my Quality and Reliability class. I had very limited knowledge of statistics but this book is very easy to read and understand for me.
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