Vous voulez voir cette page en français ? Cliquez ici.


or
Sign in to turn on 1-Click ordering.
More Buying Choices
Have one to sell? Sell yours here
Built In Test for VLSI: Pseudorandom Techniques
 
 
Share your own customer images
Search inside this book

Built In Test for VLSI: Pseudorandom Techniques [Hardcover]

Paul H. Bardell (Author), W. H. McAnney (Author), J. Savir (Author)
5.0 out of 5 stars  See all reviews (1 customer review)
List Price: CDN$ 240.99
Price: CDN$ 183.74 & this item ships for FREE with Super Saver Shipping. Details
You Save: CDN$ 57.25 (24%)
o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o
Usually ships within 1 to 3 weeks.
Ships from and sold by Amazon.ca. Gift-wrap available.

Product Details

Product Description

Book Description

This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.

From the Publisher

This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.
Inside This Book (Learn More)
First Sentence
Testing of digital circuits is a major portion of the effort in their design, production, and use. Read the first page
Explore More
Concordance
Browse Sample Pages
Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover
Search inside this book:

Tag this product

 (What's this?)
Think of a tag as a keyword or label you consider is strongly related to this product.
Tags will help all customers organize and find favorite items.
Your tags: Add your first tag
 
See most popular tags
 

Customer Reviews

1 Review
5 star:
 (1)
4 star:    (0)
3 star:    (0)
2 star:    (0)
1 star:    (0)
 
 
 
 
 
Average Customer Review
5.0 out of 5 stars (1 customer review)
 
 
 
 
Share your thoughts with other customers:
Most helpful customer reviews

5.0 out of 5 stars BEST TEST BOOK, Oct 25 1995
By A Customer
This review is from: Built In Test for VLSI: Pseudorandom Techniques (Hardcover)
This is the best test book I have read. It covers all aspects of
BIST with emphasis on pseudorandom techniques. It does not cover as
much about testing as "Digital System Testing and Testable Design" but
it is well worth its price tag.
Help other customers find the most helpful reviews 
Was this review helpful to you? Yes No

Share your thoughts with other customers: Create your own review
Most Helpful Customer Reviews on Amazon.com (beta)
Amazon.com: 4.5 out of 5 stars (2 customer reviews)

1 of 1 people found the following review helpful
5.0 out of 5 stars BEST TEST BOOK, Oct 25 1995
By A Customer - Published on Amazon.com
This review is from: Built In Test for VLSI: Pseudorandom Techniques (Hardcover)
This is the best test book I have read. It covers all aspects of
BIST with emphasis on pseudorandom techniques. It does not cover as
much about testing as "Digital System Testing and Testable Design" but
it is well worth its price tag.

4.0 out of 5 stars Great Digital test book, Mar 5 2009
By Enrique Saro-nunez "kikito_1987" - Published on Amazon.com
This review is from: Built In Test for VLSI: Pseudorandom Techniques (Hardcover)
This is a great book written from professionals in the materia. I personally took the class with Dr. Savir and he is not only a great professor but this book is well worth purchasing.
› Go to Amazon.com to see both reviews  4.5 out of 5 stars 
 
 
Only search this product's reviews


Listmania!

Create a Listmania! list

Look for similar items by category

Look for similar items by subject


















i.e., each book must be in subject 1 AND subject 2 AND ...

Feedback

Would you like to update product info or give feedback on images?

Amazon.ca Privacy Statement Amazon.ca Shipping Information Amazon.ca Returns & Exchanges