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Introduction to Scanning Tunneling Microscopy, Second Edition
 
 

Introduction to Scanning Tunneling Microscopy, Second Edition [Hardcover]

C. Julian Chen

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Review

`Review from previous edition An excellent book which will benefit students and scientists alike.' Tien T. Tsong, Pennsylvania State University

`A remarkable achievement, a beautiful piece of work.' Andrew Briggs, University of Oxford

`Provides a good introduction to the field for newcomers, and also contains valuable material and hints for experts.' Heinrich Rohrer, IBM

`The great value of the Chen book is that it attempts pedagogical soundness, and so is useful for teaching.' John Spence, Arizona State University

Book Description

The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this 'bible' in the field. The second edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed of scanning to observe life phenomena in real time is a key. Advanced in this direction is presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones of nanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts.

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Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover
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Amazon.com: 5.0 out of 5 stars (1 customer review)

5 of 5 people found the following review helpful
5.0 out of 5 stars Great resource for amateur STM designers, Oct 14 2002
By James Logajan - Published on Amazon.com
This review is from: Introduction to Scanning Tunneling Microscopy (Hardcover)
This may be a good resource for professionals also - but they'll have to speak for themselves. As an amateur, I found the instrumentation section extremely valuable. It is primarily because of that section that I give the text 5 stars. After plowing through a great many journal papers I eventually found that most of the theory and practice of building an STM had in fact been nicely distilled by Chen. There are some minor mistakes (e.g. discrepencies between the text and some figures), but nothing critical that I could see. A number of disparate but relevant prerequisite topics are addressed in the appendices with moderate success.
If there is a peer or superior alternative to the instrumentation and design aspects of STMs, I would love to hear of it!
 Go to Amazon.com to see the review  5.0 out of 5 stars 

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