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A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis [Hardcover]

Victor E. Buhrke , Ron Jenkins , Deane K. Smith

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Book Description

Nov. 19 1997 0471194581 978-0471194583 1
The first hands-on guide to XRD and XRF sampling and specimen preparation

Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips.

With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials
* Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more
* Features special chapters on specimen preparation equipment and XRF standards
* Contains useful bibliography and helpful references.

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Product Description

From the Publisher

This book is the first to discuss specimen preparation for X-ray diffraction (XRD) and X-ray fluorescence (XRF), powerful analytical tools for determining molecular composition and structure. Written to help either beginners or experienced X-ray analysts, it offers detailed information on the correct ways to select a sample from a bulk material and prepare a specimen from the sample, thus avoiding serious and costly errors in analysis. Each chapter provides essential theoretical background, step-by-step methods, suggestions about finding necessary equipment needed, and recommended literature references.

From the Back Cover

The first hands-on guide to XRD and XRF sampling and specimen preparation

Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips.

With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials
* Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more
* Features special chapters on specimen preparation equipment and XRF standards
* Contains useful bibliography and helpful references.

Inside This Book (Learn More)
First Sentence
In most analytical laboratories the analyst is presented with a sample for analysis, the sample, in turn, having been taken from the bulk. Read the first page
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Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover
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Amazon.com: 5.0 out of 5 stars  1 review
5.0 out of 5 stars Is as it says Dec 22 2010
By JQD - Published on Amazon.com
Format:Hardcover|Verified Purchase
This is a very thorough book discussing the practical aspects of sample preparation for XRD and XRF. This may seem rather banal or trivial, until one finds oneself with a sample mounting issue that biases, skews or otherwise corrupts the data.

Multiple authors contribute their shared experience to describe the best techniques, and they discuss the impact these techniques will have on the collected data.

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