Scanning Transmission Electron Microscopy: Imaging and Analysis [Hardcover]

Stephen J. Pennycook (Editor), Peter D. Nellist (Editor)

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Product Details

Hardcover: 774 pages
Publisher: Springer; 2011 edition (Mar 22 2011)
Language: English
ISBN-10: 1441971998
ISBN-13: 978-1441971999
Product Dimensions: 25.7 x 18.3 x 3.6 cm
Shipping Weight: 1.7 Kg

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Review

“To describe in 18 chapters the current status in a wide field, a dazzling list of no less than 44 distinguished authors has been assembled. Fortunately, the role of the editors has continued well beyond the point of producing their own chapters to ensure that these different contributions are reasonably well integrated with a useful index….The editors’ assertion that the experiment of focusing a beam of electrons down to an atomic scale and measuring its scattering has spectacular outcomes is most abundantly proved here.” --Archie Howie, Microscopy and Microanalysis

Product Description

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

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Front Cover | Copyright | Table of Contents | Excerpt | Index

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Amazon.com: 5.0 out of 5 stars (1 customer review)

1 of 1 people found the following review helpful

5.0 out of 5 stars most comprehensive STEM book available, Jun 6 2011

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This review is from: Scanning Transmission Electron Microscopy: Imaging and Analysis (Hardcover)

I own a dozen TEM books, and I must say this is the most comprehensive STEM book that I have. The book reviews the history of STEM first, and then goes over basics of STEM imaging, the Ronchigram, simulation/image interpretation, EELS and EDS. The book also covers various applications of STEM and Cs-corrected STEM to materials characterization with plenty of newest data. Leading microscopists contributed to the book. I wish that the book had a chapter on principles of Cs correction. ..the book discusses very little about Cs correction.

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